Pubblicazioni

Autori:

Dall'Ora, Nicola; Fraccaroli, Enrico; Vinco, Sara; Fummi, Franco

Titolo:

Multi-Discipline Fault Modeling with Verilog-AMS

Anno:

2021

Tipologia prodotto:

Contributo in atti di convegno

Tipologia ANVUR:

Contributo in Atti di convegno

Lingua:

Inglese

Formato:

Elettronico

Titolo del Convegno:

2021 4th IEEE International Conference on Industrial Cyber-Physical Systems (ICPS)

Luogo:

Victoria, BC, Canada

Periodo:

10-12 May 2021

ISBN:

978-1-6654-3045-6

Intervallo pagine:

237-243

Parole chiave:

Multi-discipline; Fault modeling; Verilog-AMS

Breve descrizione dei contenuti:

Constructing a simulable model of a production line is crucial to ensure adequate maintenance, but it is nonetheless too complex due to the presence of highly heterogeneous components. In this perspective, Verilog-AMS is a promising solution, as it allows to cover different levels of details, from transistor-level and digital components to multi-physical dynamics. This paper shows how Verilog-AMS can be used to model production line components by exploiting multiple disciplines effectively. Furthermore, we will prove that Verilog-AMS allows efficient modeling of faults by inserting saboteurs and mutants in multi-physics descriptions. This methodology allows the definition of a multi-discipline fault injection technique that can be used to generate valuable data to support any analysis based on faulty temporal series, like predictive maintenance.

Pagina Web:

https://ieeexplore.ieee.org/document/9468133

Id prodotto:

121780

Handle IRIS:

11562/1045842

ultima modifica:

27 gennaio 2025

Citazione bibliografica:

Dall'Ora, Nicola; Fraccaroli, Enrico; Vinco, Sara; Fummi, Franco, Multi-Discipline Fault Modeling with Verilog-AMS  in IEEE International Conference on Industrial Cyber-Physical Systems (ICPS) , Atti di "2021 4th IEEE International Conference on Industrial Cyber-Physical Systems (ICPS)" , Victoria, BC, Canada , 10-12 May 2021 , 2021 , pp. 237-243

Consulta la scheda completa presente nel repository istituzionale della Ricerca di Ateneo