| Argomento | Persone | Descrizione |
|---|---|---|
| Electrical and electronic analysis of semiconductor devices. |
Elisa Artegiani
Alessandro Romeo |
Current-density measurement with solar simulator for the analysis of solar conversion efficiency, capacitance-voltage and drive level capacitance profiling of semiconductor devices, admittance spectroscopy. |
| Structural properties of thin film materials |
Alessandro Romeo
|
Study of grain size, grain morphology, grain structure by atomic force microscopy. Analysis of thin film morphology and profilometry respectively by optical imaging and by profilometer. |
| Thin films growth |
Alessandro Romeo
|
Deposition and growth of polycrystalline thin films, through different deposition techniques such as RF-Sputtering, Vacuum evaporation, Pulsed electron deposition, spin coating, chemical bath, sublimation in controlled atmosphere. Post-deposition treatments for recrystallization and doping through 2 muffle furnaces, three tubular furnaces. |
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